《電子技術應用》
您所在的位置:首頁 > 視頻 > rongzhen xia:A Design and Test Method of Mini-Hopkinson Impact System for MEMS Device Testing based on Electromagnetic Pulse Launch

rongzhen xia:A Design and Test Method of Mini-Hopkinson Impact System for MEMS Device Testing based on Electromagnetic Pulse Launch

2016-08-09
關鍵詞: MEMS 微納米